Process Control SystmRez 2308 COMPLETE 4 POINT PROBE SYSTEM The SystmRez system includes everything needed to make 4 point probe measurements AutoRez 2101 RESISTIVITY MEASUREMENT SYSTEM SHEET RESISTIVITY 1 milliohm per square to 10 megohms per square. BULK RESISTIVITY Program substrate thickness up to 100 mils. READOUT DIRECTLY IN OHMS / SQUARE From 1 milliohm per square to 10 megohms per square. PowrRez 2208B FOUR POINT PROBE STATION POWERED PROBE DOWN Smooth Z motion with PCC's exclusive SofTouch™ design. POWERED THICKNESS SET From thin wafers to 600 mil substrates. VACUUM CHUCK FOR 8" (200 mm) WAFERS Up to 8" (200 mm) wafers securely held on the chuck. VersaRez 2021 ADJUSTABLE FOUR POINT PROBE HEAD ADJUST THE FORCE Dial in the force from 40 to 180 grams / tip. REPLACE THE PROBE TIPS Easy to remove, easy to re-insert. Note: The three components of this system are available separately and can be used with other manufactures' equipment. Please see more detailed descriptions on the following pages.