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 MDC
MERCURY PROBES are precision instruments that enable rapid, convenient,
and non-destructive measurements of semiconductor samples by probing
wafers with mercury to form contacts of well-defined area.MDC MERCURY PROBES may be connected to C-V plotters, computerized semiconductor measurement systems, curve tracers, or doping profilers for a variety of measurements. MERCURY PROBES eliminate time consuming metallization and their convenience make them ideal tools for production process monitoring applications. Their accuracy and reproducibility make them attractive for R&D applications. There are 2 types of Mercury Probes available. Standard and Mapping versions. All MDC Mercury Probes have 3 function contacts with the unique MDC dot-ring configuration. This allows contact to be made in both front-back and front-front modes allowing for measurements on semi-insulating substrates. Also, a guard ring can be configured. The standard probes come in 3 sizes. 3", 6", and 8" diameters. The Mapping Mercury Probe allows for repeatable contacts over a wafer using X and Y controls. Mapping Mercury Probes come 8" and 12" diameters. Nominal contact diameter is 760 microns. Special diameter platforms or contact areas are available. |
