| Materials
Development Corporation |
|
C-V and Advanced Analysis Systems
Materials Development Corporation has a computerized
system for you. And that system comes complete with all necessary
hardware and the most versatile software available. The CSM/Win Semiconductor
Measurement Systems developed by MDC include a wide selection of instruments
and probe stations combined with the latest CSM/Win custom software.
Backed by over two decades experience in C-V plotting instrumentation
the MDC product family has grown with advances in the semiconductor
industry and this is why MDC has remained the leader in the C-V measurement
field.
CSM/Win SYSTEM FAMILY Instrumentation, Probe
Stations and Software
With years of development, MDC carefully integrates all instruments,
probe stations, multiplexers, and software into fully operational
systems that features the largest choice of proven measurement and
analysis functions - the utmost in accuracy and ease of use. For
customers who have their own hardware, MDC offers complete software
packages to unify the equipment into a semiconductor measurement
powerhouse. The CSM/Win Semiconductor Measurement System family
includes over one hundred different instrument configurations.
For more information on MDC product lines
visit their website at http://www.mdc4cv.com |
