Introduction
Accelerated
Analysis is a specialist supplier of failure analysis tools,
textbooks and seminars; a source for hard to find information
and tools needed by failure analysts.
PRECISION TOOLS FOR SEM SAMPLE PREPARATION
Anyone can produce perfect polished
cross sections to very precise locations on a chip using Accelerated
Analysis polishing fixtures and materials. No special skills
are required. Samples are not encapsulated and remain on the
mount throughout the polishing , visual inspection and SEM
inspection.
PRECISION TOOLS FOR FAILURE ANALYSIS
BY HOT SPOT DETECTION
Hot
Spot Detection using Liquid Crystals identifies failure sites
on active devices.
RECENT DEVELOPMENTS
Accelerated Analysis innovations has
introduced updated and completely new product lines:
- Liquid
crystal for hot spot detection is now available in premixed
solutions preferred by many analysts.
- A new
line of parallel polish and cross section fixtures - compatible
with all 8 inch polishers. We also supply Struers high quality
polishers.
- A
complete line of diamond, alumina, and SiC abrasives on
Mylar film.
- Our wet
nitride etch, GREEN™, has been well received as an etch
for thinning or removing plasma nitride for failure analysis
and other deprocessing tasks. GREEN™ is selective to both
aluminum and oxide. It offers an alternative to dry plasma
etching and avoids the possibility of plasma charging damage.
Because
we use the materials we offer, we can provide application
tips to help solve customers' challenges. Accelerated Analysis
has the experience and knowledge necessary to select and use
failure tools efficiently and effectively. Short courses on
specific topics may be arranged for presentation at your site.
Comprehensive training courses are offered for engineers and
technicians. |
